M3I
Complete Mueller characterization
for Visible and SWIR
Overview
Designed by Bossa Nova Vision, the M3I is a state-of-the-art Mueller matrix imaging polarimeter that can capture the complete 16-parameter Mueller matrix of transparent, semi-transparent, and metamaterial samples.
Operating purely in transmission mode, this advanced Visible and Short-Wave Infrared (SWIR) polarimeter utilizes a high-precision Division of Time architecture to extract every possible polarization property in a single acquisition sequence. It serves as an essential diagnostic tool for optical engineering and R&D laboratories that require absolute optical mapping and total material characterization.
Principle
While standard polarimeters capture only a fraction of a material’s optical behavior, the M3I imaging system measures the entire polarization footprint. By calculating the full Mueller matrix at the pixel level, the system directly outputs complex optical metrics, including retardance magnitude and orientation, optical rotation, circular dichroism, depolarization, and polarization-dependent loss (PDL).
The M3I provides complete characterization capabilities for evaluating liquid crystals, optical gratings, and anisotropic sample characteristics, as well as measuring thin-film refractive indices and internal mechanical stress. Highly intuitive, the dedicated M3I software interface allows users to:
Acquire and load comprehensive Mueller measurement data.
Calculate, display, and export the full Mueller matrix alongside advanced polarization images (Polarizance, Depolarization, etc.).
Simulate the interaction of any pre-determined polarized or unpolarized homogeneous plane wave with the analyzed element to instantly map the Degree Of Polarization (DOP), Angle Of Polarization (AOP), and Ellipticity.
Technology
Characterizing a complete Mueller matrix requires calculating all 16 distinct parameters [M00 … M33], necessitating at least 16 independent optical measurements. The M3I system is engineered around a “Division of Time polarimeter” architecture, incorporating dual polarization modulators that dynamically shift the polarization state between each acquired frame.
During operation, the M3I acquires 16 consecutive high-resolution raw frames and instantly computes the exact Mueller matrix for every pixel in the field of view. Factory-calibrated by Bossa Nova Vision, the M3I is optimized for the absolute transmission characterization of complex optical elements through the precise measurement of their Mueller parameters.
Sample Example
Parameters
Applications
Non-Destructive Testing (NDT) & Material Characterization: As a highly accurate photoelastic stress mapping polarimeter, the M3I excels in industrial manufacturing and quality control. By measuring retardance magnitude and optical rotation in transmission mode, engineers can instantly detect hidden mechanical stress, molding defects, and birefringence in transparent materials—such as architectural glass, industrial polymers, and molded plastics—long before they lead to structural failure.
Semiconductor & Silicon Wafer Inspection (SWIR): Configured with the Short-Wave Infrared (SWIR) wavelength option, the M3I imaging polarimeter easily penetrates materials that are opaque to visible light. This makes it an indispensable inspection tool for mapping internal photoelastic stress, retardance, and anisotropic characteristics directly through silicon wafers and semiconductor components.
Biomedical & Pharmaceutical Tissue Imaging: The M3I maps advanced polarization metrics like circular dichroism and depolarization in transmission mode. This non-invasive imaging capability allows pathologists and biochemists to evaluate chiral drug molecules in solution and map complex collagen networks in tissue biopsies—all without the need for destructive chemical dyes.
Display Technology & AR/VR Optics: Manufacturers of liquid crystal displays (LCD), specialized optical gratings, and waveplates rely on the complete Mueller characterization of the M3I to ensure total optical purity. By delivering high-resolution maps of optical rotation and retardance, optical engineers can guarantee that light propagates through AR/VR headset lenses without unwanted distortion or polarization scattering.
Specifications
M3I specifications are summarized in the following table:
(1220mm x 560mm x 200mm) | ||
(pixels) | (contact us for higher resolution) | (contact us for higher resolution) |
field of view | ||
(incl. amendment 2015/863/EU (RoHS)) FCC Class B | ||
Contact us for more details.
* Due to Bossa Nova Vision continuous improvement policy, specifications are subject to change without notice.
User Manual
