M3I

Complete Mueller characterization

IMG_1563

Overview

The Mueller Matrix Measurement imaging (M3i) system is uniquely designed to capture the entire range of Mueller parameters of a sample in transmission mode. It is capable of providing high accuracy data on many parameters :

        • retardance magnitude and orientation
        • optical rotation
        • polarization transmission
        • polarization-dependent loss
        • circular dichroism
        • depolarization effects
        • insertion loss, etc.

The M3i is the ideal tool for a complete sample characterization.

Currently available in the visible range and short-wave infrared, the M3i is coupled with dedicated software that combines basic and advanced features that range from data acquisition to simulating the effect of polarized/unpolarized light on the sample.

Principle

To analyze an object’s optical qualities, it is necessary to understand how it will affect light passing through it. This can be done using Mueller formalism which provides a complete picture of the optical properties of a sample at a particular wavelength.

The M3i has the capacity to measure everything from liquid crystals, gratings, and anisotropic sample characteristics to thickness and refractive index of films and stress measurement in the material. Easy to use, its unique interface can:

  • Acquire Mueller measurement data
  • Load various saved measurements
  • Calculate/display and export Mueller matrix and advanced polarization images (Polarizance, Depolarization, etc.)
  • Simulate the effect of a pre-determined polarized or unpolarized homogeneous plane wave impinging on an element analyzed with the M 3i system (Degree Of Polarization, Angle Of Polarization, Ellipticity, etc.).

Technology

The Mueller matrix contains 16 parameters [M00 … M33]. Therefore, at least 16 measurements are necessary to estimate its value. The Mueller Matrix Measurement infrared system is based on “Division of Time polarimeter” architecture. It encloses two polarization modulators that change the polarization state between each frame acquired. 

The M3i system acquires 16 consecutive images called raw frames (referred as “Raws”) and computes the corresponding Mueller matrix for each pixel of the scene. The M 3i system has been calibrated on Bossa Nova Vision factory and is designed to characterize the transmission of optical element through the measurement of its Mueller parameters.

Below are examples of common sample results obtained with the M3i:

PictureM3I

Sample Example

Quarter wave plate with horizontal slow axis

Parameters

Specifications

M3I specifications are summarized in the following table:

SPECIFICATIONS
Enclosure dimensions
48 x 22 x 8.5 in
(1220mm x 560mm x 200mm)
Interface
IEEE 802.3 1000Base-T
Wavelength
Visible
SWIR
Minimum resolution
(pixels)
1024x1024
(contact us for higher resolution)
320x240
(contact us for higher resolution)
Polarizer extinction ratio
>10000:1
>3000:1
Standard sample
field of view
80x60mm
Synchronization
USB
Options
Available in ISO5 for clean rooms
Regulations
CE: 2014/30/EU (EMC), 2011/65/EU
(incl. amendment 2015/863/EU (RoHS))
FCC Class B
Software
M3i software

Contact us for more details.

* Due to Bossa Nova Vision continuous improvement policy, specifications are subject to change without notice.

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